102 FUNSU - System Switches in the switching unit


Restrictions	Functions of the AMO	Error messages and advisories
Interrelationships	Parameter Description

The AMO FUNSU processes jobs for the RTO (Routine Test Organisation) of the SWU for

•

starting and stopping of individual routine tests,

•

changing the start frequency of routine tests,

•

changing time parameters,

•

displaying the status and outputting the control data.

In addition, the switches ’Load from hard disc’ and ’Flash memory to be loaded’ can be set to load the peripheral loadware and/or flash memory respectively from the HD.

RTO test options in the SWU.

The following test configurations are available;

•

All SWU routine tests,

•

All routine tests in all or specific CC halves,

•

All routine tests in all or specific LTG halves,

•

Specific groups of routine tests.

The default value set by the AMO is ’TRUE’, which means that the RTO tests may be started.

Changing the start frequency of some routine tests.

The start frequency of individual routine tests can be controlled with the parameter (RJFREQ).

Table 21

Test is never started

Test is started in every run

Test is started in every 2nd run

Test is started in every 255th run

Changing time parameters.

The following time parameters can be changed for each group of routine tests using the AMO FUNSU:

•

Test group start time ( RJSTART );

•

Time at which this test group will not be restarted after having paused between runs ( RJSTOP );

•

Pause time between two test runs ( RJPAUSE );

Displaying the status and control data.

The following RTO status can be displayed;

•

AM (administration and maintenance) start authorization for the RTO of a unit (CC or LTG);

•

FA (fault analysis) start authorization for the RTO of a unit (CC or LTG);

•

AM start authorization for a test group;

•

RTO status of a test group;

•

Start frequency of individual routine tests.

The following can also be displayed for each test group;

•

•

•

pause time between tests.

Basic initialization of the static RTO memory

Table 22

Basic initialization

Start authorization AM

Start authorization FA

Start authorization AM

Start time (HH)

Test frequency IPREQ

Test frequency CCHREQ

Test frequency MBUAREQ

Test frequency IOCCAREQ

Test frequency IOCGREQ

Test frequency DCLREQ

Test frequency MBUATEST

Test frequency IOCCATST

Test frequency CCHIECBS

Test frequency IPTEST

Start authorization AM

Start time (HH)

Test frequency DPTIMOUT

Test frequency DPWDCTR0

Test frequency DPWDCTR1

Test frequency DPRDYREQ

Test frequency DCLTEST (*1)

Prüfhäufigkeit BDHWYTST

Test frequency CCHIECBS

Test frequency MEMACEA

Test frequency MEM1AREQ

Test frequency GSNMTSCM

Test frequency LTUCUPRQ

Test frequency SYMCHKAL

Test frequency CONWADP

Test frequency SURVPATA

Start authorization AM

Start time (HH)

Test frequency CIRA

Test frequency CIRAENDA

Start authorization AM

Start time (HH)

Test frequency UPAREQ

Test frequency LTUAHWYA

Test frequency STBYHWYA

Test frequency SIUTSTTR

Test frequency SIUDTO

Test frequency SIUPTO

Test frequency SIUCSCR

Test frequency SIUPCSCR

Test frequency LTUCCCBM

Test frequency SIUPTDSA

Test frequency SIUTDSA

(*1) At EC HW these tests concern the DDCL module

Microprocessor checks in the LTUC.

Sporadic errors cause a hardware reset of the LTUC . This subsequently causes the shelf concerned to go out of service. This operation failure is not reported to the dependability system, so that the latter cannot respond appropriately. Only when the microprocessor is tested by the RTO the LTUC is put back into service. The test cycle of the RTO microprocessor tests has thus been stepped up so that a failure of the LTUC microprocessor is detected as rapidly as possible.

In order to avoid the system load it creates, the LTUC microprocessor test will not be contained in the universal microprocessor test routine UPAREQ, but rather will be implemented as a seperate routine, LTUCUPRQ .

The repeat time (test intervals or test cycle) will be preset at 3 minutes. Users may alter the test cycle as required. However, it is advisable to leave no more than 3 minutes between the test routines, i.e. RJPAUSE of the group RJP1 multiplied by RJFREQ of the LTUCUPRQ routine should not exceed 180 (seconds).

The action SET is used to set the tests to be carried out by the RTO. However, the changes made by the action SET will only become active after the action EXEC has been called to execute the changes.

Setting the Switch ’Load From Hard Disc’

The loadware is loaded into the LTG RAM during the first system boot and saved there for restarts.

The boards are then supplied with loadware exclusively from the LTG alone and not, as they were previously, from the hard disc. Exchanging loadware on the hard disc basically has no effect at all in the peripherals, unless an LTG is reloaded.

To allow loadware to be exchanged selectively by plugging in and pulling out boards, the central peripheral initialization task (PIT ) defines an SW switch which, if set, causes the LW to be loaded from the hard disc when a board is plugged in or an LTG HR occurs.

Setting the Switch ’Flash memory to be loaded’

After a hard restart (without reload) all flash memory modules are, like any other restartable module, not explicitly reloaded. A newly configured module has to be explicitly marked as having to be reloaded. This is done using the parameter ’Flash memory to be loaded’. When set, all flash memory modules will be reloaded with new loadware the next time a load job takes palce (Restart or reload).

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